Analog and custom digital circuits fail due to process variations and aging effects (especially NBTI and HCI). In this project our goal was to reduce the rate of failures by determining better design . techniques that allow one to properly design in the correct amount of calibration, and to then calibrate rapidly. The design algorithms were largely based on usinga set of modeling techniques, known as Surrogate Modeling, to efficiently map the design space, so that the design variables could be optimized. The calibration algorithm, based on direct optimization, outperforms traditional calibration algorithms. These algorithms were demonstrated on RF and custom digital test circuits designed in collaboration with Raytheon (and pictured above.)

This research was/is funded by: DARPA.

Selected Publications and PhD Theses arising (with links either to a copy of the submitted document or to the version listed in IEEE Xplore):

• E.J. Wyers, "Direct Search Calibration Algorithms for Digitally Reconfigurable Radio Frequency Integrated Circuits," Ph.D. Dissertation, 2013.. (Downloadable.)
• Ting Zhu, "A Surrogate Model-based Framework for Design and Macromodeling of Self-calibrated Analog Circuits", Ph.D. Dissertation, 2012. (Downloadable.)
• M. Yelten, "Variability and Reliability in Nanoscale Circuits : Simulation, Design, Monitoring, and Characterization," Ph.D. Dissertation, 2011. (Downloadable.)
• Wyers, E.J.; Morton, M.A.; Sollner, T.C.L.G.; Kelley, C.T.; Franzon, P.D., "A Generally Applicable Calibration Algorithm for Digitally Reconfigurable Self-Healing RFICs," in Very Large Scale Integration (VLSI) Systems, IEEE Transactions on , vol.PP, no.99, pp.1-1. (On IEEE Xplorer).
• Wyers, E.J.; Steer, M.B.; Kelley, C.T.; Franzon, P.D., "A Bounded and Discretized Nelder-Mead Algorithm Suitable for RFIC Calibration," Circuits and Systems I: Regular Papers, IEEE Transactions on , vol.60, no.7, pp.1787,1799, July 2013. (IEEE Xplorer). .
• T. Zhu, M. Steer, P. Franzon, “Surrogate model-based self-calibrated design for process and temperature compensation in Analog/RF circuits,” in IEEE Design and Test, Vol. PP, No. 99, 2013.. (Downloadable). .
• M.B. Yelten, T. Zhu, S. Koziel, P.D. Franzon, M.B. Steer, “Demystifying Surrogate Modeling for Circuits and Systems,” in IEEE Circuits and Systems Magazine, VOl. 12, No. 1, 2012, pp. 45-63.. (IEEE Xplorer). .
• M.B. Yelten, P.D. Franzon, M.B. Steer, “Analog Negative Bias Temperature Instability Monitoring Circuit,” in IEEE Trans. Device and Materials Reliability, Vol. 12., No. 1, 2012, pp. 177-179.. (IEEE Xplorer). .
• M.B. Yelten, T. Zhu, S. Koziel, P.D. Franzon, M.B. Steer, “Demystifying Surrogate Modeling for Circuits and Systems,” in IEEE Circuits and Systems Magazine, VOl. 12, No. 1, 2012, pp. 45-63.. (IEEE Xplorer). .
• M.B. Yelten, P.D. Franzon, M.B. Steer, “Analog Negative Bias Temperature Instability Monitoring Circuit,” in IEEE Trans. Devices and Materials Reliability, Vol. 12, No. 1, 2012, pp. 177-179.. (IEEE Xplorer). .
• M.B. Yelten, P.D. Franzon and M.B. Steer, “Surrogate Model-Based Analysis of Analog Circuits – Part I. Variability Analysis,” in IEEE Trans. Device and Materials Reliability, Vol. PP, Issue 99, 2011.. (IEEE Xplorer). .
• .MB. Yelten, P.D. Franzon and M.B. Steer, “Surrogate Model-Based Analysis of Analog Circuits – Part II. Reliability Analysis,” in IEEE Trans. Device and Materials Reliability, Vol. PP, Issue 99, 2011.. (IEEE Xplorer). .